Yokogawa AQ7420 High-Resolution Reflectometer: Precision Optical Testing for Microcracks and Spurious Noise Reduction

The Yokogawa AQ7420 High-Resolution Reflectometer offers unparalleled precision for detecting microcracks and minimizing spurious noise, ensuring reliable reflection and insertion loss measurements. Ideal for demanding optical environments, it provides comprehensive analysis and superior noise reduction, making it the perfect choice for robust network testing.

Yokogawa AQ7420 Datasheet

Categories: Optical Spectrum Analyzers, Test Equipment For Metrology Tag: Reflectometer

Description
Specifications

Yokogawa AQ7420 High-Resolution Reflectometer

Enhance Your Optical Network Testing with Precision

For professionals who require exceptional accuracy in optical reflection measurements, the Yokogawa AQ7420 High-Resolution Reflectometer stands out as the premier solution. This advanced instrument is designed for critical communication infrastructures that demand high precision and reliability, including space satellite links, submarine fibre optic connections, datacentres, cell towers (FTTA), and silicon photonics research.

Exceptional Detection Capability

The AQ7420 Reflectometer is uniquely capable of detecting microcracks in optical connectors—flaws that can lead to unpredictable and potentially serious failures. This capability is particularly vital in environments subject to physical stress, including movement, vibration, and fluctuations in temperature. By accurately identifying the quantity and location of reflections, the AQ7420 ensures the reliability of optical networks.

Comprehensive Reflection and Loss Analysis

One of the standout features of the AQ7420 is its ability to conduct simultaneous measurements of multiple reflections and insertion loss. With an uncertainty of ±3 dB in reflection measurements and ±0.02 dB in insertion loss using the optical sensor head, this device provides comprehensive analytical capability. The AQ7420 is not just a tool for detection; it transforms optical inspection by optimizing both reflection and insertion loss measurements traditionally overlooked due to the inadequacy of older models.

Minimized Spurious Noise for Simplified Analysis

Spurious noise can lead to inaccurate analysis in conventional reflectometers, causing false appearances where no actual reflection exists. The Yokogawa AQ7420 effectively reduces spurious noise to a competitive −100 dB, eliminating ghost effects and simplifying waveform analysis significantly. Reduced spurious noise ensures data integrity and enhances the confidence with which you can interpret results.

Unprecedented Precision and Methodology

With a measurement distance of 100 mm (approximately 4 inches) and a spatial resolution of 40 μm, the AQ7420 delivers unmatched precision in its measurements. This capability is critical for ensuring pristine quality control and advanced diagnostics in high-demand optical communication environments.

Why Choose the Yokogawa AQ7420?

Precision: Detect microscopic flaws with unparalleled accuracy.
Comprehensive Analysis: Measure reflection and insertion loss simultaneously for full insight.
Spurious Noise Reduction: Experience reduced noise interference for true reflection data.
Versatile Application: Ideal for a range of industries from space to telecommunications.

Explore the transformative capabilities of the Yokogawa AQ7420 High-Resolution Reflectometer today. Investing in this device means ensuring your optical networks remain robust, reliable, and high-performing. For professionals who won’t compromise on quality or precision, the AQ7420 is an indispensable addition to any optical testing toolkit.

Specifications

Specifications

AQ7420 High-Resolution Reflectometer

Items	Specifications
Measurement wavelength	−13NN: 1310 nm, −1315: 1310 nm / 1550 nm
Measurement distance range*1	100 mm
Distance sampling resolution*1	1, 4, 8 μm
Spatial resolution2, 3	40 μm or less
Distance mesurement repeatability4, 6	50 μm or less
Back reflection measurement range	Nomal range: −14.7 to −85 dB, High sensitivity range: −50 to −100 dB
Back reflection measurement uncertainty 2, 5, 6, 7	Normal range: ±3 dB (−14.7 to −85 dB) High sensitivity range: ±3 dB (−50 to −90 dB), ±5 dB (−90 to −100 dB)
Spurious noise*8	Normal range: −85 dB or less9 High sensitivity range: −100 dB or less10
Measurement time*11	Approx. 6 seconds
Applicable Optical fiber	SMF (ITU-T G.652)
Master cord	SMF (ITU-T G.652), FC/PC or SC/PC connector
Functions	By control software
Performance guarantee environment12, 13	18 to 28°C, ±2°C after reference, 20 to 70%RH, no condensation
Operating environment	10 to 40°C, 20 to 70%RH (Below 28°C), 20 to 50%RH (Below 35°C), 20 to 35%RH or less (Below 40°C), no condensation
Storage environment	−10 to 50°C, 20 to 80%RH (Below 40°C), 20 to 40%RH (Below 50°C), no condensation
Power requirements	100 to 240 VAC, 50/60 Hz, 120 VA or less (AC adapter)
Dimensions and Mass*14	430 (W) × 132 (H) × 350 (D) mm (Excluding protector and handle), aprrox. 8 kg
Laser safety standards	EN 60825-1:2014+A11:2021, IEC 60825-1:2014, GB/T 7247.1-2023 Class 1
Recommended calibration period	1 year
Standard accessories	Master cord, Relay cord, FC adapter, Distance Adjustment cord, USB cable, Control software (CD), AC Adapter
Control software main functions	Optical return loss distribution waveform, The location of the reflection point, Optical reflection loss display, Judgement waveform scaling, Marker function, etc
Recommended PC*15	CPU: CORE i5, 2 GHz or more, 64 bit, OS: Windows11, RAM: 8 GB or mote, Storage space: 1 GB or more, Display resolution: 1920 × 1080 dots or more, USB2.0 or higher

*All specifications are after 1 hour of warm-up and REF under the measurement condition.

*The product specification is when the wavelength is set to 1310 nm.

*1 For a refractive index of 1.467 (from the tip of the attached optical fiber) *2 Measurement distance 0 mm *3 Half value width of reflected light pulse waveform. *4 In the case of an air-conditioned room at a temperature of 23°C to 24°C, excluding the effect of optical fiber expansion due to temperature, when stability mode is ON. *5 The return loss value may fluctuate by up to about 3 dB by moving the fiber. *6 2 *7 Averaging 1 time (−14.7 dB to

−90 dB), 5 times averaging if smaller than −90 dB. *8 Pseudo reflected waveform due to device-specific characteristics. *9 When measuring pseudo reflected light amount −20 dB (0 mm position), averaging 5 times. *10 When measuring pseudo reflected light amount −50 dB (0 mm position), averaging 5 times. *11 Measurement distance 100 mm, distance measurement sample resolution 8 μm, high sensitivity range: −50 to −100 dB, averaging 1 time, varies depending on PC operating environment. *12 No abrupt temperature change (±10°C/h). *13 Specifications covered: Back reflection measurement uncertainty, distance measurement repeatability, spurious noise. *14 Excluding accessories. *15 A personal computer for control is not included. Please prepare a personal computer with recommended specifications or higher.