The Yokogawa AQ6374E: High-Performance Bench-top Optical Spectrum Analyser
Introducing the Yokogawa AQ6374E, your cutting-edge solution for optical spectrum analysis. Covering wavelengths from visible light to communication wavelengths, this bench-top marvel is the go-to tool for spectral measurement of a diverse range of optical devices, including laser measurements.
Unmatched Functionality and Performance
The AQ6374E stands out from the crowd with its wide measurement wavelength range—an invaluable feature for evaluating nonlinear optical phenomena of laser excitation and loss characteristics of optical fibers. Add to this a broad optical dynamic range, you have a device that can accurately measure the Side Mode Suppression Ratio (SMSR), a key indicator for various lasers used in industrial equipment, bio and medical fields, and research institutions.
Designed for precision and versatility, the Yokogawa AQ6374E is equipped with high wavelength resolution performance, a purge feature for more reliable measurements, and a built-in cut filter for high order diffracted light. The standout feature? A large, multi-touch touchscreen that offers a user-friendly experience akin to operating a tablet device.
When it comes to specs, the Yokogawa AQ6374E is a powerhouse. It boasts a wide dynamic and level range, fast measurement speed, and an impressive wavelength range. With high wavelength resolution and accuracy, a built-in filter, and sensitivity of -80 dBm (900 – 1600 nm), this optical spectrum analyser sets the standard in optical device measurement.
Ideal for a Variety of Applications
Whether you’re involved in industrial laser equipment, AR, VR, and MR laser modules, Bio and Medical research, optical fiber, or quantum technologies, the AQ6374E is your trusted partner. It’s a hit among universities, research labs, and optical device manufacturers—and with a 12-month warranty, you can trust in the quality and durability of the Yokogawa brand.
Order the Yokogawa AQ6374E today—your all-in-one solution to optical spectrum analysis.