Pendulum’s DETECTUS EMC-Scanners are high-resolution, affordable scanners that come in three different sizes to fit most DUTs. They combine very-high scan resolution of 0.1 mm with probe head rotation, and the best-in-class scanning software to deliver powerful visualization of the EMC test.

For boards with components of substantially different heights, the optional laser distance meter will enable you to follow the DUT’s topography and measure at a fixed distance from the DUT, automatically creating a precise 3D-model of the DUT. With Pendulum’s DETECTUS EMC-Scanners, you’ll be able to quickly and easily identify any potential problems with your product’s electromagnetic compatibility, ensuring that it meets all applicable standards.

The Pendulum Detectus EMC-Scanners are a complete scanner system that can be used to test the field strength of an object. The system consists of the EMC-Scanner Hardware package, the Detectus Scanning SW (DSS), a Spectrum Analyzer, and a PC to run the scanner SW.

The object to be tested is placed on the coordinate board, and a small near-field probe is moved in a controlled and repeatable path above the test object, registering the field strength. The probe output signal in every position is measured by the Spectrum Analyzer, and transferred to the scanner SW. The smart SW combines the spatial information (X,Y,Z) with the spectrum in that position, and presents detailed results.

Leading Performance from the Detectus designers

With 25 μm step size of the scanner, you can pinpoint emission sources in densely packed designs. You can even follow emission hot spots inside an IC, using the IC option

You can scan emissions up to 10 GHz, with the standard Pendulum Probe kits. If the user has near-field probes going up to higher frequencies, e.g. 70 GHz, these can normally be attached and used for EMC-scanning. The SW has no limits, but you must of course use a Spectrum Analyzer that support the frequency range.

Within the Detectus HRE series you can choose from two different sizes, with or without probe rotation, to fit most test objects. The scan area (WxDxH) is:

• 280x180x85mm (3D or 4D*)
• 390x290x130 mm (3D or 4D*)

* 4D = 3D xyz movement, plus probe rotation 0 to 360^o

Advantages of the Detectus HRE scanner

In R&D

Using the EMC-Scanner during the early stages of design enables you to detect potential emission and immunity problems before they become integrated into the product and expensive to correct.

If a product has failed a test at a test house, normally you only learn which frequency failed, not the location of the noise source. The EMC-Scanner can help you find the source, and repeated measurements while redesigning your product helps you lower the emission levels.

Similarly, if your problem was immunity, you can (optionally) scan for sensitive areas and repeat measurements while strengthening your product.

You can compare different design solutions and make comparative measurements of electromagnetic emissions. You can even analyze the EMI-noise inside an IC or a compact module, thanks to the ultra-high-resolution step size (25 μm)

In Q&A

The EMC-Scanner can help you maintain a high quality in the production line. You can make measurements on samples from the production line and easily compare them with a reference. That way you can make sure that, for example, a change of supplier of a component doesn’t affect the emission spectra in a negative way.

World class SW lets you SEE electromagnetic fields

The easy-to-use and feature-rich DSS SW let you measure and visualize the intensity and the location of a radiation source at a component level – or even inside a component. The results of such a measurement can be shown as two- or three-dimensional colored maps. The measurements can easily be repeated creating objective, comparative measurement results.

Measurements can be saved and later compared with board-level changes, thanks to the exact repetitive scanning. The SW even allows to subtract two scanning results to emphasize the true difference of any board layout – or component – change.

The post The Pendulum/Detectus EMC-Scanners -| HRE series appeared first on rapid-tech.

Pendulum’s DETECTUS EMC-Scanners are high-resolution, affordable scanners that come in three different sizes to fit most DUTs. They combine very-high scan resolution of 0.1 mm with probe head rotation, and the best-in-class scanning software to deliver powerful visualization of the EMC test.

For boards with components of substantially different heights, the optional laser distance meter will enable you to follow the DUT’s topography and measure at a fixed distance from the DUT, automatically creating a precise 3D-model of the DUT. With Pendulum’s DETECTUS EMC-Scanners, you’ll be able to quickly and easily identify any potential problems with your product’s electromagnetic compatibility, ensuring that it meets all applicable standards.

The Pendulum Detectus EMC-Scanners are a complete scanner system that can be used to test the field strength of an object. The system consists of the EMC-Scanner Hardware package, the Detectus Scanning SW (DSS), a Spectrum Analyzer, and a PC to run the scanner SW.

The object to be tested is placed on the coordinate board, and a small near-field probe is moved in a controlled and repeatable path above the test object, registering the field strength. The probe output signal in every position is measured by the Spectrum Analyzer, and transferred to the scanner SW. The smart SW combines the spatial information (X,Y,Z) with the spectrum in that position, and presents detailed results.

Leading Performance from the Detectus designers

With 0.1mm step size of the scanner, you can pinpoint emission sources in densely packed designs, at comparable cost to 1mm scanners

You can scan emissions up to 10 GHz, with the standard Pendulum Probe kits. If the user has near-field probes going up to higher frequencies, e.g. 70 GHz, then these can easily be attached and used for EMC-scanning. The SW has no limits, but you must of course use a Spectrum Analyzer that supports the frequency range.

Within the Detectus SCN series you can choose from various sizes, to fit most test objects. The scan table comes in four basic sizes (WxDxH):

• 200×100 mm (2D scanning without Z-axis and probe rotation)
• 200x100x100 mm (4D = 3D scanning with probe rotation)
• 300x200x100 mm (4D = 3D scanning with probe rotation)
• 600x400x300 mm (4D = 3D scanning with probe rotation)

Advantages of the Detectus SCN scanner

In R&D

Using the EMC-Scanner during the early stages of design enables you to detect potential emission and immunity problems before they become integrated into the product and expensive to correct.

If a product has failed a test at a test house, normally you only learn which frequency failed, not the location of the noise source. The EMC-Scanner can help you find the source, and repeated measurements while redesigning your product helps you lower the emission levels.

Similarly, if your problem was immunity, you can (optionally) scan for sensitive areas and repeat measurements while strengthening your product.

You can compare different design solutions and make comparative measurements of electromagnetic emissions.

In Q&A

The EMC-Scanner can help you maintain a high quality in the production line. You can make measurements on samples from the production line and easily compare them with a reference. That way you can make sure that, for example, a change of supplier of a component doesn’t affect the emission spectra in a negative way.

World class SW lets you SEE electromagnetic fields

The easy-to-use and feature-rich DSS SW let you measure and visualize the intensity and the location of a radiation source at a component level – or even inside a component. The results of such a measurement can be shown as two- or three-dimensional colored maps. The measurements can easily be repeated creating objective, comparative measurement results.

Measurements can be saved and later compared with board-level changes, thanks to the exact repetitive scanning. The SW even allows to subtract two scanning results to emphasize the true difference of any board layout – or component – change.

The post The Pendulum/Detectus EMC-Scanners -| SCN series appeared first on rapid-tech.

The GSP-9300B provides a Topographic display mode that is capable of identifying continuous or random signals based on color temperature. Spectrogram mode provides a time axis on spectrum display, which allows user to observe signals variations in relation to time. Split window mode enables setting of parameters for each display window individually. The GSP-9300B also features user-friendly user interfaces such as display mode, help, multi-languages, and fast data logging. Software and interfaces include USB/RS-232/LXI/MicroSD/GPIB (option)/DVI output and dedicated PC software IVI Driver.

With its unique features, such as auto wake-up, sequence function, and limit line testing, GSP-9300B is specially designed for production lines. As a result of the patent heat conduction design, GSP-9300B has the ability to reduce warm-up time so that production can proceed more quickly. Tracking generator, carrying bag, battery module, EMI antenna set, and rack accessories are available as options. GSP-9300B’s compact design makes it suitable for field testing or the integration of automatic test systems.

As a result, GSP-9300B is a stable, light, and all-purpose test equipment, which is most suitable for the educational market, production lines, and general signal monitoring applications, etc. In addition, the price of GSP-9300B is beyond your imagination, making it the best choice for users on a budget.

Features

• Frequency Range: 9kHz ~ 3 GHz
• 0.025ppm Frequency Stability and 1ppm aging Rate
• Built-in Preamplifier, 50dB Attenuator, and Sequence Function
• RBW: 1Hz ~ 1MHz
• Sensitivity: -149dBm/Hz (@PreAmp on)
• Built-in AM/FM Demodulation & Analysis
• Built-in P1dB point, Harmonic, Channel Power, N-dB bandwidth, OCBW, ACPR, SEM, TOI, CNR, CTB, CSO, Noise Marker, Frequency
• Counter, Time Domain Power, Gated Sweep
• Built-in Spectrogram, Topographic and Dual-View Display Modes
• Remote Control Interface: LAN, USB, RS-232
• Options: Tracking Generator, GPIB Interface

Accessories

Power Cord, Certificate of Calibration, CD-ROM (with Quick Start Guide, User Manual, Programming Manual, SpectrumShot Software, SpectrumShot Guide & IVI Driver)

Optional Accessories
GSC-009, Soft Carrying Case
GRA-415, Rack Adapter Panel

The post GW Instek GSP-9300B Spectrum Analyzer – 3 GHz appeared first on rapid-tech.

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Basic Set 1

Basic Set 2

Mid Range Set

Advanced Set

Call us on FreePhone 1800 358 531
and ask us about our
EMI/EMC Pre-Compliance
Solutions

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The device is available with country-specific DUT output connectors.

SPECIFICATIONS

The post TEKBOX TBL5016-2 50uH Line Impedance Stabilization Network appeared first on rapid-tech.

The R&S ENV216 two-line V-network for disturbance voltage measurements on single-phase EUTs

Features

Air-core design and artificial hand

The R&S ENV216 two-line V-network is based on air-core inductances and contains an artificial hand.

Switch-selectable high pass filter of 150 kHz

To prevent the measuring receiver from being overdriven by low-frequency spectra of high level, a 150 kHz highpass filter can be cut in.

Built-in 10 dB attenuator pad

To ensure standard impedance irrespective of the receiver input attenuation, the R&S ENV216 is equipped with a 10 dB attenuator pad.

Built-in pulse limiter (can be switched off)

A built-in pulse limiter which can be switched off protects the receiver input.

Remote control with TTL levels (compatible with Rohde & Schwarz measuring receivers)

TTL control inputs that can be driven by controllers and Rohde & Schwarz measuring receivers are provided for remote control in automatic test systems (phase selection and activation of highpass filter). Optocouplers prevent pick-up of external disturbance.

Key facts

A female connector with protective earth contacts is provided for connecting the EUT. Various models with country-specific connector systems are available.

Owing to its compact design and low weight, the R&S ENV216 is ideal for frequently varying applications and especially for on-site disturbance voltage measurements on single-phase EUTs. Note that high leakage currents are produced because of the standard design of these V-networks. The networks should therefore be connected to a low-impedance protective earth system. In uncertain cases, an isolating transformer should be used

The post R&S ENV216 Two-Line V-Network appeared first on rapid-tech.

The R&S HM6050 Two Line Impedance Stabilization Network (LISN)is used as a reproduction of supply networks in order to be able to carry out the line-bound interference emissions as part of measurements and tests for electromagnetic compatibility (EMC).

The HM6050 suppresses high-frequency interference from the supply network, establishes a standardized impedance for the device under test, and decouples the high-frequency radio interference voltages from the device under test in order to be able to supply it to a spectrum analyzer or EMI receiver.

The R&S HM6050 is a single-phase V-network simulation for the frequency range from 9 kHz to 30 MHz (according to CISPR 16) and is suitable for maximum currents up to 16A

Technical data

• Frequency range: 9 kHz to 30 MHz
• The picture resistance: Z=50 Ω II (50 μH + 5 Ω)
• Max. operating current: 16 A
• Hand to the formation: 220 pF + 511 Ω
• Protective conductor according to education: 50 Ω II 50 μH
• Transient Limiter Frequency range: 150 kHz to 30 MHz
• Transient Limiter Transmission loss: 10 dB (+1.5/- 0.5 dB)

The post R&S HM6050 Two Line Impedance Stabilization Network (LISN) appeared first on rapid-tech.

The combination of very good RF characteristics and all of the important functions needed for fast, precise measurement and evaluation of the EMC of a device under test in accordance with commercial standards is unmatched in this class of instrument.

The diverse analysis capabilities, high measurement speed and time-saving automated test routines make the R&S ESL the obvious choice for any development lab that needs to prepare for the final EMC certification tests.

Features & Benefits

Precise, reproducible measurement results due to very good RF characteristics

The post R&S ESL EMI Test Receiver 9 kHz to 3 GHz or 9 kHz to 6 GHz appeared first on rapid-tech.

The probes act similar as wide bandwidth antennas, picking up radiated emissions from components, PCB traces, housing openings or gaps and from any other parts that could be emitting RF. The probes are usually connected to a spectrum analyser. Scanning the probe over the surface of a PCB assembly or housing quickly identifies locations which emit electromagnetic radiation. By changing to a probe with smaller size, the origination of the emissions can be further narrowed down.

Additional applications are RF immunity tests by feeding a RF signal into the probe and radiating it into potentially susceptible circuit sections: Furthermore the probes can be used in the field of repair or debugging to track down issues in RF signal chains by contactless measurement of RF signal levels.

One more application is non- invasive measurement of RF building blocks such as modulators or oscillators. Frequency, phase noise and spectral components can be measured in conjunction with a low noise preamplifier. The TBWA2/20dB and TBWA2/40db wideband amplifiers are connected between EMC probe and Spectrum Analyzer to increase the dynamic range of the measurements.

The post TEKBOX TBPS01 EMC Near Field Probe Set appeared first on rapid-tech.